- 专利标题： Display condition analysis device, display condition analysis method, and program recording medium
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申请号： US16776103申请日： 2020-01-29
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公开(公告)号： US11594052B2公开(公告)日： 2023-02-28
- 发明人: Kyota Higa , Ruihan Bao , Takami Sato , Ryota Mase , Kota Iwamoto
- 申请人： NEC Corporation
- 申请人地址： JP Tokyo
- 专利权人： NEC Corporation
- 当前专利权人： NEC Corporation
- 当前专利权人地址： JP Tokyo
- 优先权： JP2014-049001 20140312
- 主分类号： G06V20/80
- IPC分类号： G06V20/80 ; G06F16/583 ; G06Q10/08 ; G06V20/68 ; G06Q30/06 ; G06V20/64 ; G06Q10/087
摘要：
Disclosed is a display condition analysis device which is capable of analyzing the display conditions of products. This display condition analysis device is provided with: a product recognition means for recognizing, from a display image taken of products on display, the products in the display image; and a display condition analysis means for analyzing, on the basis of the positions of the recognized products, the display conditions of the products on display.
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