• Patent Title: State estimation apparatus, state estimation method, and computer-readable recording medium
  • Application No.: US17425790
    Application Date: 2019-01-28
  • Publication No.: US11609149B2
    Publication Date: 2023-03-21
  • Inventor: Yu KiyokawaShigeru KasaiShohei Kinoshita
  • Applicant: NEC Corporation
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • International Application: PCT/JP2019/002810 WO 20190128
  • International Announcement: WO2020/157810 WO 20200806
  • Main IPC: G01M5/00
  • IPC: G01M5/00 G06K9/62
State estimation apparatus, state estimation method, and computer-readable recording medium
Abstract:
A state estimation apparatus 1 includes an acquisition unit 2 that acquires deterioration information indicating a deterioration state of each structural object and a learning unit 3 that learns common information that is common between pieces of the deterioration information and estimation index information that is used for estimating a deterioration state of a target structural object, using the deterioration information as input.
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