发明授权
- 专利标题: Fault detection
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申请号: US17199279申请日: 2021-03-11
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公开(公告)号: US11625504B2公开(公告)日: 2023-04-11
- 发明人: Yanis Linge , Simon Landry
- 申请人: STMICROELECTRONICS (ROUSSET) SAS
- 申请人地址: FR Rousset
- 专利权人: STMICROELECTRONICS (ROUSSET) SAS
- 当前专利权人: STMICROELECTRONICS (ROUSSET) SAS
- 当前专利权人地址: FR Rousset
- 代理机构: Seed Intellectual Property Law Group LLP
- 优先权: FR2002563 20200316
- 主分类号: G06F21/72
- IPC分类号: G06F21/72
摘要:
The present disclosure relates to a method of fault detection in an application, by an electronic circuit, of a first function to a message, including the steps of generating, from the message, a non-zero even number N of different first sets, each including P shares; applying, to the P shares of each first set, one or a plurality of second functions delivering, for each first set, a second set including Q images; and cumulating all the images, starting with at most Q-1 images selected from among the Q images of a same second set.
公开/授权文献
- US20210286902A1 FAULT DETECTION 公开/授权日:2021-09-16
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