Invention Grant
- Patent Title: Accurate modeling of equipment overexcitation damage curves
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Application No.: US17123450Application Date: 2020-12-16
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Publication No.: US11631972B2Publication Date: 2023-04-18
- Inventor: Ritwik Chowdhury , Dale S. Finney , Normann Fischer , Matchyaraju Alla
- Applicant: Schweitzer Engineering Laboratories, Inc.
- Applicant Address: US WA Pullman
- Assignee: Schweitzer Engineering Laboratories, Inc.
- Current Assignee: Schweitzer Engineering Laboratories, Inc.
- Current Assignee Address: US WA Pullman
- Agent Jared L. Cherry; Richard M. Edge
- Main IPC: G01R31/34
- IPC: G01R31/34 ; H02H1/00 ; G05B19/042 ; H02H7/04 ; G01R31/62

Abstract:
The present disclosure relates to systems and methods for protecting against and mitigating the effects of over-excitation of elements in electric power systems. In one embodiment, a system consistent with the present disclosure may comprise a point pair subsystem to receive a plurality of point pairs that define an over-excitation curve for a piece of monitored equipment. The system may receive a plurality of measurements corresponding to electrical conditions associated with the piece of monitored equipment. A logarithmic interpolation subsystem may determine a logarithmic interpolation corresponding to one of the plurality of measurements based on the plurality of point pairs. An over-excitation detection subsystem may detect an over-excitation condition based on the logarithmic interpolation, and a protective action subsystem may implement a protective action based on the over-excitation condition.
Public/Granted literature
- US20220190581A1 ACCURATE MODELING OF EQUIPMENT OVEREXCITATION DAMAGE CURVES Public/Granted day:2022-06-16
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