Invention Grant
- Patent Title: Display device and inspection method thereof
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Application No.: US17116206Application Date: 2020-12-09
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Publication No.: US11636788B2Publication Date: 2023-04-25
- Inventor: Ki Nyeng Kang , Min Joo Kim , Tae Hoon Yang , Sang Hoon Lee , Seon Beom Ji
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Priority: KR10-2020-0032003 20200316
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G09G3/32

Abstract:
A display device inspection method includes: checking connection failures of light emitting elements included in a pixel and connected in series based on a first control signal, a second control signal, and a voltage of an initialization power source, wherein the pixel comprises: a pixel circuit controlling a current flowing from a first power source to a second node in response to a voltage of a first node; a first light emitting element connected to the second node; a first transistor controlling the voltage of the initialization power source supplied to the second node; a second light emitting element electrically connected between the first light emitting element and a second power source; and a second transistor having a first electrode connected to a third node between the first light emitting element and the second light emitting element, and a gate electrode connected to a first inspection control line.
Public/Granted literature
- US20210287579A1 DISPLAY DEVICE AND INSPECTION METHOD THEREOF Public/Granted day:2021-09-16
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