Invention Grant
- Patent Title: Automatic generation of probe path for surface inspection and part alignment
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Application No.: US17162787Application Date: 2021-01-29
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Publication No.: US11644294B2Publication Date: 2023-05-09
- Inventor: Marco Adriano , Lee Sanders , Richard Matthew Stubley
- Applicant: Autodesk, Inc.
- Applicant Address: US CA San Francisco
- Assignee: Autodesk, Inc.
- Current Assignee: Autodesk, Inc.
- Current Assignee Address: US CA San Francisco
- Agency: Fish & Richardson P.C.
- Main IPC: G01B5/008
- IPC: G01B5/008 ; G01B5/20 ; G05B19/418

Abstract:
Methods, systems, and apparatus, including medium-encoded computer program products, for automatic generation of probe path for surface inspection and part alignment. A mesh model is obtained of at least a portion of a three dimensional model of a part to be manufactured using a computer-controlled manufacturing system. Vertex points from the mesh model are collected to be an initial set of probing points in a three dimensional space of a working coordinate system of the computer-controlled manufacturing system, and filtering out points are filtered out from the initial set of probing points based on coverage of the least a portion of the three dimensional model to produce a final set of probing points. The final set of probing points is provided for use in alignment or surface inspection of the part by the computer-controlled manufacturing system.
Public/Granted literature
- US20220244029A1 AUTOMATIC GENERATION OF PROBE PATH FOR SURFACE INSPECTION AND PART ALIGNMENT Public/Granted day:2022-08-04
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