- Patent Title: Classification of magnet tampering conditions on a metering device
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Application No.: US17387948Application Date: 2021-07-28
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Publication No.: US11650234B2Publication Date: 2023-05-16
- Inventor: Nagaraja Sundaresh , Shalu Singhvi , Rajesh Mahapatra , Anil Bhide
- Applicant: Honeywell International Inc.
- Applicant Address: US NJ Morris Plains
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NC Charlotte
- Agency: Ortiz & Lopez, PLLC
- Agent Luis M. Ortiz; Kermit D. Lopez
- Main IPC: G01R22/06
- IPC: G01R22/06

Abstract:
A method and system for detecting tampering of an energy meter can involve, in a first phase: gathering magnetic field sample data, an average magnetic field strength, a minimum magnetic field strength, and a maximum magnetic field strength from a magnetic field condition applied to an energy meter by a magnetic sensor that measures a magnetic field in one or more directions, and using learning coefficients calculated from the magnetic field sample data and the average magnetic field strength, the minimum magnetic field strength, and the maximum magnetic field strength to classify with a classifier, magnet tampering conditions with respect to the energy meter. In a second phase, a magnet tamper event can be identified with respect to the energy meter when the magnet tampering condition classified by the classifier is greater than a magnetic detection threshold.
Public/Granted literature
- US20230030025A1 CLASSIFICATION OF MAGNET TAMPERING CONDITIONS ON A METERING DEVICE Public/Granted day:2023-02-02
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