Invention Grant
- Patent Title: Method for measurement of electromagnetic field, and system therefor
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Application No.: US17547815Application Date: 2021-12-10
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Publication No.: US11668741B2Publication Date: 2023-06-06
- Inventor: Chang Hee Hyoung , Jong Hwa Kwon , Jung Hwan Hwang
- Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Applicant Address: KR Daejeon
- Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Agency: LRK Patent Law Firm
- Priority: KR 20210011264 2021.01.27
- Main IPC: G01R27/28
- IPC: G01R27/28 ; G01R29/10

Abstract:
An electromagnetic wave measurement system may include: a reference receiving device; a plurality of auxiliary receiving devices; and a control device connected to the reference receiving device and the plurality of auxiliary receiving devices, wherein the reference receiving device has a wider dynamic range than the plurality of auxiliary receiving devices, the control device collects a frequency-specific measurement value from each of the reference receiving device and the plurality of auxiliary receiving devices, and the frequency-specific measurement value of each of the auxiliary receiving devices is calibrated based on the frequency-specific measurement value of the reference receiving device.
Public/Granted literature
- US20220236311A1 METHOD FOR MEASUREMENT OF ELECTROMAGNETIC FIELD, AND SYSTEM THEREFOR Public/Granted day:2022-07-28
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