Invention Grant
- Patent Title: Data management, reduction and sampling schemes for storage device failure
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Application No.: US16872194Application Date: 2020-05-11
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Publication No.: US11669754B2Publication Date: 2023-06-06
- Inventor: Nima Elyasi , Vikas Sinha , Qinling Zheng , Changho Choi
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Main IPC: G06F21/00
- IPC: G06F21/00 ; G06N5/04 ; G06F16/23 ; G06N20/00 ; G06Q10/0631

Abstract:
In a method for training a machine learning model, the method includes: segmenting, by a processor, a dataset from a database into one or more datasets based on time period windows; assigning, by the processor, one or more weighted values to the one or more datasets according to the time period windows of the one or more datasets; generating, by the processor, a training dataset from the one or more datasets according to the one or more weighted values; and training, by the processor, the machine learning model using the training dataset.
Public/Granted literature
- US20210264298A1 DATA MANAGEMENT, REDUCTION AND SAMPLING SCHEMES FOR STORAGE DEVICE FAILURE Public/Granted day:2021-08-26
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