- 专利标题： Systems and methods for determining relationships between defects
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申请号： US16845797申请日： 2020-04-10
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公开(公告)号： US11681282B2公开(公告)日： 2023-06-20
- 发明人: Andrew Poh , Andre Frederico Cavalheiro Menck , Arion Sprague , Benjamin Grabham , Benjamin Lee , Bianca Rahill-Marier , Gregoire Omont , Jim Inoue , Jonah Scheinerman , Maciej Albin , Myles Scolnick , Paul Gribelyuk , Steven Fackler , Tam-Sanh Nguyen , Thomas Powell , William Seaton
- 申请人： Palantir Technologies, Inc.
- 申请人地址： US CA Palo Alto
- 专利权人： Palantir Technologies Inc.
- 当前专利权人： Palantir Technologies Inc.
- 当前专利权人地址： US CO Denver
- 代理机构： Sheppard Mullin Richter & Hampton LLP
- 主分类号： G05B23/02
- IPC分类号： G05B23/02 ; G06N20/00 ; G06Q10/0639 ; H01L21/66 ; G06F16/2457 ; G06F11/07 ; G06F16/35 ; G06F16/28
摘要：
Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
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