- Patent Title: Systems and methods for determining relationships between defects
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Application No.: US16845797Application Date: 2020-04-10
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Publication No.: US11681282B2Publication Date: 2023-06-20
- Inventor: Andrew Poh , Andre Frederico Cavalheiro Menck , Arion Sprague , Benjamin Grabham , Benjamin Lee , Bianca Rahill-Marier , Gregoire Omont , Jim Inoue , Jonah Scheinerman , Maciej Albin , Myles Scolnick , Paul Gribelyuk , Steven Fackler , Tam-Sanh Nguyen , Thomas Powell , William Seaton
- Applicant: Palantir Technologies, Inc.
- Applicant Address: US CA Palo Alto
- Assignee: Palantir Technologies Inc.
- Current Assignee: Palantir Technologies Inc.
- Current Assignee Address: US CO Denver
- Agency: Sheppard Mullin Richter & Hampton LLP
- Main IPC: G05B23/02
- IPC: G05B23/02 ; G06N20/00 ; G06Q10/0639 ; H01L21/66 ; G06F16/2457 ; G06F11/07 ; G06F16/35 ; G06F16/28

Abstract:
Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
Public/Granted literature
- US20200241518A1 SYSTEMS AND METHODS FOR DETERMINING RELATIONSHIPS BETWEEN DEFECTS Public/Granted day:2020-07-30
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