- 专利标题: Aluminum alloy wire, aluminum alloy strand wire, covered electrical wire, and terminal-equipped electrical wire
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申请号: US17685514申请日: 2022-03-03
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公开(公告)号: US11682499B2公开(公告)日: 2023-06-20
- 发明人: Misato Kusakari , Tetsuya Kuwabara , Yoshihiro Nakai , Taichiro Nishikawa , Yasuyuki Otsuka , Hayato Ooi
- 申请人: Sumitomo Electric Industries, Ltd. , AutoNetworks Technologies, Ltd. , Sumitomo Wiring Systems, Ltd.
- 申请人地址: JP Osaka
- 专利权人: Sumitomo Electrical Industries, Ltd.,AutoNetworks Technologies, Ltd,Sumitomo Wiring Systems, Ltd.
- 当前专利权人: Sumitomo Electrical Industries, Ltd.,AutoNetworks Technologies, Ltd,Sumitomo Wiring Systems, Ltd.
- 当前专利权人地址: JP Osaka; JP Yokkaichi; JP Yokkaichi
- 代理机构: McCarter & English, LLP
- 代理商 Michael A. Sartori
- 优先权: JP 16213153 2016.10.31
- 主分类号: H01B1/02
- IPC分类号: H01B1/02 ; C22C21/08 ; C22C21/10 ; C22C21/14 ; C22C21/16 ; C22F1/05 ; C22F1/053 ; C22F1/057 ; H01B5/08 ; H01B7/00 ; H01R4/18
摘要:
An aluminum alloy contains at least 0.03 mass % and at most 1.5 mass % of Mg, at least 0.02 mass % and at most 2.0 mass % of Si, and a remainder composed of Al and an inevitable impurity, a mass ratio Mg/Si being not lower than 0.5 and not higher than 3.5. In a transverse section of the aluminum alloy wire, a rectangular surface-layer void measurement region having a short side of 30 μm long and a long side of 50 μm long is taken from a surface-layer region extending by up to 30 μm in a direction of depth from a surface of the aluminum alloy wire. A total cross-sectional area of voids present in the surface-layer void measurement region is not greater than 2 μm2.
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