Invention Grant
- Patent Title: Method and apparatus for interference measurement in wireless communication system
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Application No.: US16973621Application Date: 2019-06-14
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Publication No.: US11683710B2Publication Date: 2023-06-20
- Inventor: Eunyong Kim , Daeyoung Seol
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Gyeonggi-do
- Agency: The Farrell Law Firm, P.C.
- Priority: KR 20180078224 2018.07.05
- International Application: PCT/KR2019/007209 2019.06.14
- International Announcement: WO2020/009348A 2020.01.09
- Date entered country: 2020-12-09
- Main IPC: H04W24/10
- IPC: H04W24/10 ; H04B17/27 ; H04B17/345 ; H04B17/364 ; H04L5/00

Abstract:
The present disclosure relates to a method for controlling interference measurement by an interference measurement control device, the method comprising the steps of: calculating distance information between a transmission side transmitting a reference signal for interference measurement and a reception side receiving the reference signal; calculating, on the basis of the distance information, signal delay information related to a delay time required until the reference signal transmitted from the transmission side arrives at the reception side; and determining control information for the transmission side or the reception side on the basis of the signal delay information.
Public/Granted literature
- US20210250796A1 METHOD AND APPARATUS FOR INTERFERENCE MEASUREMENT IN WIRELESS COMMUNICATION SYSTEM Public/Granted day:2021-08-12
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