- 专利标题: Platform, systems, and methods for identifying characteristics and conditions of property features through imagery analysis
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申请号: US17989991申请日: 2022-11-18
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公开(公告)号: US11687768B2公开(公告)日: 2023-06-27
- 发明人: Takeshi Okazaki
- 申请人: Aon Benfield Inc.
- 申请人地址: US IL Chicago
- 专利权人: Aon Benfield, Inc.
- 当前专利权人: Aon Benfield, Inc.
- 当前专利权人地址: US IL Chicago
- 代理机构: Gardella Grace P.A.
- 主分类号: G06Q40/00
- IPC分类号: G06Q40/00 ; G06F18/241 ; G06N20/20 ; G06T7/00 ; G06N3/08 ; G06V10/46 ; G06V20/13
摘要:
In an illustrative embodiment, methods and systems for automatically assessing damage vulnerability of a property include accessing digital images of a property parcel having a first structure thereon, classifying features visible in the images, including at least one feature of the first structure and at least one feature present in a neighborhood of the property parcel, to determine at least one of characteristic of each feature, determining a spatial relationship between a first structure and each manmade and/or natural feature represented by the classified features, and applying a property loss risk profile, based at least in part on the determined characteristics and the determined spatial relationships, to calculate a risk estimate for the first structure under at least one risk scenario.
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