- 专利标题: Semiconductor arrangement and method for producing the same
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申请号: US16792682申请日: 2020-02-17
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公开(公告)号: US11688712B2公开(公告)日: 2023-06-27
- 发明人: Olaf Hohlfeld
- 申请人: Infineon Technologies AG
- 申请人地址: DE Neubiberg
- 专利权人: Infineon Technologies AG
- 当前专利权人: Infineon Technologies AG
- 当前专利权人地址: DE Neubiberg
- 代理机构: Murphy, Bilak & Homiller, PLLC
- 优先权: EP 157627 2019.02.18
- 主分类号: H01L23/00
- IPC分类号: H01L23/00 ; H01L27/12
摘要:
A semiconductor arrangement includes a semiconductor substrate having a dielectric insulation layer and at least a first metallization layer arranged on a first side of the dielectric insulation layer. The first metallization layer includes at least two sections, each section being separated from a neighboring section by a recess. A semiconductor body is arranged on one of the sections of the first metallization layer. At least one indentation is arranged between a first side of the semiconductor body and a closest edge of the respective section of the first metallization layer. A distance between the first side and the closest edge of the section of the first metallization layer is between 0.5 mm and 5 mm.
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