Invention Grant
- Patent Title: Error correction device and method for generating syndromes and partial coefficient information in a parallel
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Application No.: US17199803Application Date: 2021-03-12
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Publication No.: US11689224B2Publication Date: 2023-06-27
- Inventor: Eunae Lee , Kijun Lee , Yeonggeol Song , Myungkyu Lee , Seokha Hwang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Muir Patent Law, PLLC
- Priority: KR 20200067163 2020.06.03
- Main IPC: H03M13/15
- IPC: H03M13/15 ; G06F11/10

Abstract:
An error correction device according to the technical idea of the present disclosure includes a syndrome generation circuit configured to receive data and generate a plurality of syndromes for the data, a partial coefficient generation circuit configured to generate partial coefficient information on a part of a coefficient of an error location polynomial by using the data while the plurality of syndromes are generated, an error location determination circuit configured to determine the coefficient of the error location polynomial based on the plurality of syndromes and the partial coefficient information, and obtain a location of an error in the data by using the error location polynomial, and an error correction circuit configured to correct the error in the data according to the location of the error.
Public/Granted literature
Information query
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