Invention Grant
- Patent Title: Self-test procedure for a control device
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Application No.: US17390713Application Date: 2021-07-30
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Publication No.: US11700681B2Publication Date: 2023-07-11
- Inventor: Richard S. Camden , Jordan H. Crafts , Vidur Garg , Kevin L. Gascho , Alexander F. Mosolgo , Dragan Veskovic , Sean R. Pearson
- Applicant: Lutron Technology Company LLC
- Applicant Address: US PA Coopersburg
- Assignee: Lutron Technology Company LLC
- Current Assignee: Lutron Technology Company LLC
- Current Assignee Address: US PA Coopersburg
- Agent Michael Czarnecki; Glen Farbanish; Philip Smith
- Main IPC: G01R29/26
- IPC: G01R29/26 ; G01R31/44 ; H05B47/115 ; H04B17/23 ; H04B17/345 ; H04B17/14 ; H05B47/105 ; H05B47/19 ; H05B45/10

Abstract:
A control module for a lighting fixture may include an input circuit (e.g., a wireless communication circuit) that may be susceptible to noise generating by a noise-generating source (e.g., a lighting control device in the lighting fixture). The control circuit may execute a self-test procedure to determine if the magnitude of the noise is acceptable or unacceptable for normal operation of the control module. During the self-test procedure, the control circuit may measure a noise level at a connection of the input circuit and determine if the noise level causes the self-test procedure to fail. The control circuit may control the lighting load to multiple intensities, measure noise levels of the output signal at each intensity, and process the noise levels to determine if the test has passed or failed. The control circuit may illuminate a visual indicator to provide an indication that the self-test procedure has failed.
Public/Granted literature
- US20210360761A1 Self-Test Procedure for a Control Device Public/Granted day:2021-11-18
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