- 专利标题: Assembly error correction for assembly lines
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申请号: US17646063申请日: 2021-12-27
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公开(公告)号: US11703824B2公开(公告)日: 2023-07-18
- 发明人: Matthew C. Putman , Vadim Pinskiy , Eun-Sol Kim , Andrew Sundstrom
- 申请人: Nanotronics Imaging, Inc.
- 申请人地址: US OH Cuyahoga Falls
- 专利权人: Nanotronics Imaging, Inc.
- 当前专利权人: Nanotronics Imaging, Inc.
- 当前专利权人地址: US OH Cuyahoga Falls
- 代理机构: DLA Piper LLP (US)
- 主分类号: G05B19/406
- IPC分类号: G05B19/406 ; G05B19/19 ; G06N20/20
摘要:
Aspects of the disclosed technology provide a computational model that utilizes machine learning for detecting errors during a manual assembly process and determining a sequence of steps to complete the manual assembly process in order to mitigate the detected errors. In some implementations, the disclosed technology evaluates a target object at a step of an assembly process where an error is detected to a nominal object to obtain a comparison. Based on this comparison, a sequence of steps for completion of the assembly process of the target object is obtained. The assembly instructions for creating the target object are adjusted based on this sequence of steps.
公开/授权文献
- US20220121169A1 ASSEMBLY ERROR CORRECTION FOR ASSEMBLY LINES 公开/授权日:2022-04-21
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