Invention Grant
- Patent Title: Delay line with process-voltage-temperature robustness, linearity, and leakage current compensation
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Application No.: US17495608Application Date: 2021-10-06
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Publication No.: US11705897B2Publication Date: 2023-07-18
- Inventor: Xu Zhang , Xuhao Huang , Shitong Zhao
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM INCORPORATED
- Current Assignee: QUALCOMM INCORPORATED
- Current Assignee Address: US CA San Diego
- Agency: Loza & Loza, LLP
- Main IPC: H03K5/14
- IPC: H03K5/14 ; H03K3/03 ; G05F1/56 ; H03F3/45 ; H04B1/40

Abstract:
An aspect relates to an apparatus, including: a ring oscillator coupled between a first node and a first voltage rail; a control circuit coupled to the first node; a delay line coupled between a second node and the first voltage rail; and a voltage regulator including an input coupled to the first node and an output coupled to the second node.
Information query
IPC分类: