发明授权
- 专利标题: Measurement method, measurement device, measurement system, and measurement program
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申请号: US17204064申请日: 2021-03-17
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公开(公告)号: US11714021B2公开(公告)日: 2023-08-01
- 发明人: Yoshihiro Kobayashi
- 申请人: Seiko Epson Corporation
- 申请人地址: JP Toyko
- 专利权人: Seiko Epson Corporation
- 当前专利权人: Seiko Epson Corporation
- 当前专利权人地址: JP Toyko
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: JP 20047308 2020.03.18
- 主分类号: G01M5/00
- IPC分类号: G01M5/00 ; E01D1/00
摘要:
A measurement method includes: a step of acquiring first observation point information including a time point when each part of an m-th moving object passes a first observation point and a physical quantity which is a response to an action; a step of acquiring second observation point information including a time point when the each part passes a second observation point and a physical quantity which is a response to an action; a step of calculating a deflection waveform of a structure generated by the each part; a step of adding the deflection waveforms to calculate an m-th moving object deflection waveform; a step of calculating a displacement waveform at the third observation point; and a step of calculating first to M-th amplitude coefficients by assuming that a waveform obtained by multiplying an m-th amplitude coefficient by the m-th moving object deflection waveform is an m-th amplitude adjusted deflection waveform, and that a sum of first to M-th amplitude adjusted deflection waveforms is approximated to the displacement waveform.
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