Invention Grant
- Patent Title: Open block management using storage charge loss margin checking
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Application No.: US17210713Application Date: 2021-03-24
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Publication No.: US11715531B2Publication Date: 2023-08-01
- Inventor: Christopher M. Smitchger , Gary F. Besinga , Renato C. Padilla , Tawalin Opastrakoon , Sampath K. Ratnam , Michael G. Miller , Vamsi Pavan Rayaprolu , Ashutosh Malshe
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C16/06
- IPC: G11C16/06 ; G11C16/34 ; G11C16/26 ; G11C16/10 ; G11C29/50

Abstract:
A system includes a memory device and a processing device, operatively coupled with the memory device, to perform operations including identifying an amount of storage charge loss (SCL) that has occurred on an open block of the memory device, the open block having one or more erased pages, determining that the amount of SCL satisfies a threshold criterion corresponding to an acceptable amount of SCL to occur on the open block, and responsive to determining that the amount of SCL satisfies the threshold criterion, keeping the open block open for programming the one or more erased pages.
Public/Granted literature
- US20220310183A1 OPEN BLOCK MANAGEMENT USING STORAGE CHARGE LOSS MARGIN CHECKING Public/Granted day:2022-09-29
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