Invention Grant
- Patent Title: Semiconductor device and manufacturing method thereof
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Application No.: US17124994Application Date: 2020-12-17
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Publication No.: US11721763B2Publication Date: 2023-08-08
- Inventor: Wen-Che Tsai , Min-Yann Hsieh , Hua-Feng Chen , Kuo-Hua Pan
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- The original application number of the division: US15496067 2017.04.25
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L21/768 ; H01L29/66 ; H01L29/417 ; H01L23/522 ; H01L23/528 ; H01L29/165 ; H01L23/485

Abstract:
A method comprises forming a source/drain region on a substrate; forming a dielectric layer over the source/drain region; forming a contact hole in the dielectric layer; forming a contact hole liner in the contact hole; removing a first portion of the contact hole liner to expose a sidewall of the contact hole; etching the exposed sidewall of the contact hole to laterally expand the contact hole; and forming a contact plug in the laterally expanded contact hole.
Public/Granted literature
- US20210143277A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Public/Granted day:2021-05-13
Information query
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