发明授权
- 专利标题: Terahertz enhanced foreign object debris discrimination for optical particulate sensor
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申请号: US17119192申请日: 2020-12-11
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公开(公告)号: US11726035B2公开(公告)日: 2023-08-15
- 发明人: David L. Lincoln , Jose-Rodrigo Castillo-Garza
- 申请人: Raytheon Technologies Corporation
- 申请人地址: US CT Farmington
- 专利权人: Raytheon Technologies Corporation
- 当前专利权人: Raytheon Technologies Corporation
- 当前专利权人地址: US CT Farmington
- 代理机构: Bachman & LaPointe, P.C.
- 主分类号: G01N21/94
- IPC分类号: G01N21/94 ; G01N21/3586 ; G01N21/3577
摘要:
A method of foreign object debris discrimination incudes illuminating particulates located within a sensing volume with a first electromagnetic radiation pulse emitted from a first source, and illuminating the particulates within the sensing volume with a second electromagnetic radiation pulse emitted from a second source, wherein the second electromagnetic radiation pulse has a second wavelength range within the terahertz (THz) regime. The first electromagnetic radiation returns and the second electromagnetic radiation returns are compared to determine a scattering ratio from the comparing step. The scattering ratio is then utilized to determine a resultant foreign object debris type of the solid objects.
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