- Patent Title: Inspection system, inspection method, program, and storage medium
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Application No.: US17827183Application Date: 2022-05-27
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Publication No.: US11727554B2Publication Date: 2023-08-15
- Inventor: Takanobu Ojima , Jeffry Fernando , Hideto Motomura
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/50 ; G06T7/90 ; G06T7/40 ; G01N21/88 ; G01N21/25 ; H04N23/56 ; H04N23/60 ; H04N23/90 ; G01N21/94 ; G01N21/84 ; G01N21/55

Abstract:
An inspection system includes an acquisition unit and a determination unit. The acquisition unit acquires an image representing a surface of an object. The determination unit performs color determination processing. The color determination processing is performed to determine a color of the surface of the object based on a plurality of conditions of reflection. The plurality of conditions of reflection are obtained from the image representing the surface of the object as acquired by the acquisition unit, and have a specular reflection component and a diffuse reflection component at respectively different ratios on the surface of the object.
Public/Granted literature
- US20220358638A1 INSPECTION SYSTEM, INSPECTION METHOD, PROGRAM, AND STORAGE MEDIUM Public/Granted day:2022-11-10
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