Invention Grant
- Patent Title: Fast and accurate mueller matrix infrared spectroscopic ellipsometer
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Application No.: US17803029Application Date: 2022-01-18
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Publication No.: US11740176B2Publication Date: 2023-08-29
- Inventor: Stefan Schoeche , Craig M. Herzinger , Steven E. Green , Martin M. Liphardt , James D. Welch
- Applicant: J.A. WOOLLAM CO., INC.
- Applicant Address: US NE Lincoln
- Assignee: J.A. WOOLLAM CO., INC
- Current Assignee: J.A. WOOLLAM CO., INC
- Current Assignee Address: US NE Lincoln
- Agent James D. Welch
- Main IPC: G01N21/21
- IPC: G01N21/21

Abstract:
An ellipsometer, polarimeter and the like system operating in the infrared spectral range (0.75 μm to 1000 μm), utilizing a tunable quantum cascade laser (QCL) source in combination with dithering capability to reduce speckle and standing wave effects, dual-rotating optical elements, a single-point detector, as well as optional means of reducing the size of the probe beam at the measurement surface and optional chopper for lock-in detection.
Public/Granted literature
- US20230184671A1 Fast and accurate mueller matrix infrared spectroscopic ellipsometer Public/Granted day:2023-06-15
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