Invention Grant
- Patent Title: Measuring an interference from a neighboring device
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Application No.: US17522419Application Date: 2021-11-09
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Publication No.: US11742969B2Publication Date: 2023-08-29
- Inventor: Jinyup Hwang , Yoonoh Yang , Sangwook Lee , Suhwan Lim , Manyoung Jung , Jongkeun Park
- Applicant: LG ELECTRONICS INC.
- Applicant Address: KR Seoul
- Assignee: LG ELECTRONICS INC.
- Current Assignee: LG ELECTRONICS INC.
- Current Assignee Address: KR Seoul
- Agency: Bryan Cave Leighton Paisner LLP
- Priority: KR 20180148556 2018.11.27
- Main IPC: H04B17/345
- IPC: H04B17/345 ; H04B17/318 ; H04W24/10

Abstract:
A disclosure of the present specification provides a method for measuring an interference from a neighboring device. The method may performed by a device and comprise: measuring, by the device, an interference based on a reference signal from a neighboring device, which is served by a neighboring cell; and transmitting, by the device, a measurement report to a serving cell, the measurement report including a measured value of the interference. One or more steps of measuring the interference and transmitting the measurement report may be performed based on configuration information. The configuration information includes one or more of start information, end information, a timer or a threshold.
Public/Granted literature
- US20220069928A1 MEASURING AN INTERFERENCE FROM A NEIGHBORING DEVICE Public/Granted day:2022-03-03
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