- 专利标题: Imaging assisted scanning spectroscopy for gem identification
-
申请号: US17962784申请日: 2022-10-10
-
公开(公告)号: US11754506B2公开(公告)日: 2023-09-12
- 发明人: Tsung-Han Tsai , Hiroshi Takahashi
- 申请人: Gemological Institute of America, Inc. (GIA)
- 申请人地址: US CA Carlsbad
- 专利权人: Gemological Institute of America, Inc. (GIA)
- 当前专利权人: Gemological Institute of America, Inc. (GIA)
- 当前专利权人地址: US CA Carlsbad
- 代理机构: DLA Piper LLP (US)
- 主分类号: G01J3/44
- IPC分类号: G01J3/44 ; G01N21/87 ; G01N21/65 ; G01J3/28
摘要:
Systems and methods here may be used for automated capturing and analyzing spectrometer data of multiple sample gemstones on a stage, including mapping digital camera image data of samples, applying a Raman Probe to a first sample gemstone under evaluation on the stage, receiving spectrometer data of the sample gemstone from the probe, automatically moving the stage to a second sample, using the image data, and analyzing the other samples.
公开/授权文献
信息查询