Invention Grant
- Patent Title: Flaw analysis of images
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Application No.: US17375207Application Date: 2021-07-14
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Publication No.: US11756092B2Publication Date: 2023-09-12
- Inventor: Dane Glasgow , David Eramian , Sandy Godsey , Justin VanWinkle
- Applicant: eBay Inc.
- Applicant Address: US CA San Jose
- Assignee: eBay Inc.
- Current Assignee: eBay Inc.
- Current Assignee Address: US CA San Jose
- Agency: FIG. 1 Patents
- Main IPC: G06Q30/0601
- IPC: G06Q30/0601 ; G06T7/00 ; G06V30/416 ; G06F18/24 ; G06T5/00

Abstract:
Systems and methods are disclosed to provide flaw accentuation to an image in an e-commerce online marketplace. In some embodiments, a method may include receiving at an online marketplace, from a seller through the Internet, an image of an item being listed for sale at the online marketplace and text related to the item being listed for sale; determining that the item includes a flaw based on the text related to the item being listed for sale or the image of the item; creating a flaw accentuation to the image; and creating a listing in the online marketplace for the item that includes the image and the flaw accentuation to the image.
Public/Granted literature
- US20210342908A1 FLAW ANALYSIS OF IMAGES Public/Granted day:2021-11-04
Information query