- 专利标题: System and method for detecting corruption of a deduplicated cloud object
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申请号: US17073667申请日: 2020-10-19
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公开(公告)号: US11762564B2公开(公告)日: 2023-09-19
- 发明人: Jagannathdas Rath , Kalyan C. Gunda
- 申请人: EMC IP Holding Company LLC
- 申请人地址: US MA Hopkinton
- 专利权人: EMC IP HOLDING COMPANY LLC
- 当前专利权人: EMC IP HOLDING COMPANY LLC
- 当前专利权人地址: US MA Hopkinton
- 代理机构: WOMBLE BOND DICKINSON (US) LLP
- 主分类号: G06F3/06
- IPC分类号: G06F3/06
摘要:
A method of detecting object corruption of deduplicated cloud objects includes a two-layered approach. In a first layer, only metadata areas from segments of a deduplicated cloud object are processed in order to detect corruptions in the metadata. If no corruption is detected in the metadata, a second layer analysis can be performed. The second layer analysis includes a progressive scanning of data only on objects that were not found to be corrupted in the first layer analysis.
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