Invention Grant
- Patent Title: System and method for targeted re-examination, inner layer defect analysis, protein identification, and photon computer
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Application No.: US17139271Application Date: 2020-12-31
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Publication No.: US11774382B1Publication Date: 2023-10-03
- Inventor: Eric Arno Vigen
- Applicant: Eric Arno Vigen
- Applicant Address: US TX Lucas
- Assignee: Eric Arno Vigen
- Current Assignee: Eric Arno Vigen
- Current Assignee Address: US TX Lucas
- Agent Mark L. Cooper
- Main IPC: G01N23/225
- IPC: G01N23/225 ; G01N33/68 ; H01J37/06 ; H01J37/244 ; G01N23/2251

Abstract:
A system includes a target object for examination; electrical transfer points associated with the target object, the electrical transfer points being an application of energy to generate one or more photons; devices for receiving and measuring electromagnetic waves from the one or more photons, to generate a data set of information, the information including at least one of direction, wavelength, and polarity; a computer having a platform to receive the data set of information; generate a model of subatomic particle placement for the photons, as determined by the data set of information; and re-examine the model at one or more of a different initiation-to-destination energy path, a different measuring position, or a different energy input; the receiving of the data set of information, generating of the model, and the re-examination of the model provides information for industrial application.
Information query