- 专利标题: Semiconductor device including superlattice pattern
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申请号: US17742985申请日: 2022-05-12
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公开(公告)号: US11777001B2公开(公告)日: 2023-10-03
- 发明人: Ilgyou Shin , Minyi Kim , Myung Gil Kang , Jinbum Kim , Seung Hun Lee , Keun Hwi Cho
- 申请人: SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 代理机构: Fish & Richardson P.C.
- 优先权: KR 20200052539 2020.04.29
- 主分类号: H01L29/15
- IPC分类号: H01L29/15 ; H01L29/78 ; H01L29/417 ; H01L29/10
摘要:
A semiconductor device includes; a substrate including a first region and a second region, a first active pattern extending upward from the first region, a first superlattice pattern on the first active pattern, a first active fin centrally disposed on the first active pattern, a first gate electrode disposed on the first active fin, and first source/drain patterns disposed on opposing sides of the first active fin and on the first active pattern. The first superlattice pattern includes at least one first semiconductor layer and at least one first blocker-containing layer, and the first blocker-containing layer includes at least one of oxygen, carbon, fluorine and nitrogen.
公开/授权文献
- US20220278204A1 SEMICONDUCTOR DEVICE INCLUDING SUPERLATTICE PATTERN 公开/授权日:2022-09-01
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