- 专利标题: Method for correcting two measured values from different analytical measuring devices and measuring point for carrying out the method
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申请号: US16942707申请日: 2020-07-29
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公开(公告)号: US11782008B2公开(公告)日: 2023-10-10
- 发明人: Erik Hennings , Dagmar Kaschuba , Marco Bezzon
- 申请人: Endress+Hauser Conducta GmbH+Co. KG
- 申请人地址: DE Gerlingen
- 专利权人: Endress+Hauser Conducta GmbH+Co. KG
- 当前专利权人: Endress+Hauser Conducta GmbH+Co. KG
- 当前专利权人地址: DE Gerlingen
- 代理机构: Endress+Hauser (USA) Holding, Inc.
- 代理商 Kelly J. Smith
- 优先权: DE 2019120446.1 2019.07.29
- 主分类号: G01N27/27
- IPC分类号: G01N27/27 ; G01N27/416
摘要:
Disclosed is an apparatus for determining a process variable of a medium in a containment, comprising first and second oscillatory elements, first and second driving/receiving units, and electronics. The first driving/receiving unit is embodied to excite the first oscillatory element using a first electrical excitation signal to execute mechanical oscillations, and to receive the mechanical oscillations of the first oscillatory element and to convert such into a first electrical, received signal, wherein the second driving/receiving unit is embodied to excite the second oscillatory element by means of a second electrical excitation signal to execute mechanical oscillations, and to receive the mechanical oscillations of the second oscillatory element and to convert such into a second electrical, received signal, and wherein the electronics is embodied to determine the process variable from the first received signal and/or the second received signal.
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