Invention Grant
- Patent Title: Liveness test method and apparatus
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Application No.: US16998172Application Date: 2020-08-20
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Publication No.: US11783639B2Publication Date: 2023-10-10
- Inventor: Byungin Yoo , Youngjun Kwak , Jungbae Kim , Jinwoo Son , Changkyo Lee , Chang Kyu Choi , Jaejoon Han
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR 20160106763 2016.08.23
- Main IPC: G06V40/40
- IPC: G06V40/40 ; G06V40/16 ; G06V40/18 ; G06F21/32 ; G06Q20/40 ; G06V40/12 ; G06N3/04 ; G06N3/08 ; G06V40/14

Abstract:
A liveness test method and apparatus is disclosed. A processor implemented liveness test method includes extracting an interest region of an object from a portion of the object in an input image, performing a liveness test on the object using a neural network model-based liveness test model, the liveness test model using image information of the interest region as provided first input image information to the liveness test model and determining liveness based at least on extracted texture information from the information of the interest region by the liveness test model, and indicating a result of the liveness test.
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