Invention Grant
- Patent Title: Subtle defect detection method based on coarse-to-fine strategy
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Application No.: US18306166Application Date: 2023-04-24
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Publication No.: US11790517B2Publication Date: 2023-10-17
- Inventor: Jun Wang , Zhongde Shan , Shuyi Jia , Dawei Li , Yuxiang Wu
- Applicant: Nanjing University of Aeronautics and Astronautics
- Applicant Address: CN Nanjing
- Assignee: Nanjing University of Aeronautics and Astronautics
- Current Assignee: Nanjing University of Aeronautics and Astronautics
- Current Assignee Address: CN Nanjing
- Priority: CN 2210483136.7 2022.05.06
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/73

Abstract:
A subtle defect detection method based on coarse-to-fine strategy, including: (S1) acquiring data of an image to be detected via a charge-coupled device (CCD) camera; (S2) constructing a defect area location network and preprocessing the image to be detected to initially determine a defect position; (S3) constructing a defect point detection network; and training the defect point detection network by using a defect segmentation loss function; and (S4) subjecting subtle defects in the image to be detected to quantitative extraction and segmentation via the defect point detection network.
Public/Granted literature
- US20230260101A1 SUBTLE DEFECT DETECTION METHOD BASED ON COARSE-TO-FINE STRATEGY Public/Granted day:2023-08-17
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