Invention Grant
- Patent Title: Nanosheet IC device with single diffusion break
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Application No.: US17406351Application Date: 2021-08-19
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Publication No.: US11791199B2Publication Date: 2023-10-17
- Inventor: Ruilong Xie , Kangguo Cheng , Juntao Li , Carl Radens
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Monchai Chuaychoo
- Main IPC: H01L21/762
- IPC: H01L21/762 ; H01L27/12 ; H01L29/66 ; H01L21/84 ; H01L27/088

Abstract:
An approach for a nanosheet device with a single diffusion break is disclosed. The device comprises of active gate is formed above the BDI. At least the SDB is also formed over BDI with dielectric filled gate. The dielectric fill forms an indentation into the remaining nanosheets, under the spacer region, or between the inner spacers, in the SDB region. The method of creating the device comprises of, forming a gate cut opening between two ends of a dummy gate of one or more gates; forming a first sacrificial material on the gate cut opening; creating a single diffusion break; removing the dummy gate and oxide layer; removing, selectively a second sacrificial material; trimming, selectively stack of nanosheets; and forming dielectric in the gate cut opening and the single diffusion break.
Public/Granted literature
- US20230054701A1 NANOSHEET IC DEVICE WITH SINGLE DIFFUSION BREAK Public/Granted day:2023-02-23
Information query
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