Invention Grant
- Patent Title: Inspection device and inspection method
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Application No.: US16996393Application Date: 2020-08-18
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Publication No.: US11796481B2Publication Date: 2023-10-24
- Inventor: Taro Imagawa , Hiroya Kusaka , Akihiro Noda
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP 18030189 2018.02.22
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01B11/30

Abstract:
An inspection device that inspects a structure with a crack, including: an obtainer that obtains images of the structure captured at mutually different times while the structure is subjected to varying loads; a crack detector that detects a crack on a surface of the structure in each image; a motion estimator that divides each image into blocks having a predetermined size, and derives motion vectors of the blocks based on a positional relation between a position of each block relative to a reference in a first image and a position of each block relative to the reference in a second image, the reference being a tip of the crack detected, the first and second images being included in the images; and an inspector that determines safety of the structure based on a difference between ones of the motion vectors of symmetric positions with respect to the crack.
Public/Granted literature
- US20200378900A1 INSPECTION DEVICE AND INSPECTION METHOD Public/Granted day:2020-12-03
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