- 专利标题: Apparatus and method for inspecting defect of secondary battery
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申请号: US16476787申请日: 2018-07-10
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公开(公告)号: US11796595B2公开(公告)日: 2023-10-24
- 发明人: Joon Sup Kang , Sung Tae Kim , Nak Gi Sung , Joon Sung Bae
- 申请人: LG CHEM, LTD.
- 申请人地址: KR Seoul
- 专利权人: LG ENERGY SOLUTION, LTD.
- 当前专利权人: LG ENERGY SOLUTION, LTD.
- 当前专利权人地址: KR Seoul
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: KR 20170087842 2017.07.11 KR 20180079155 2018.07.09
- 国际申请: PCT/KR2018/007823 2018.07.10
- 国际公布: WO2019/013534A 2019.01.17
- 进入国家日期: 2019-07-09
- 主分类号: G01R31/36
- IPC分类号: G01R31/36 ; H01M10/42 ; G01R31/389
摘要:
An apparatus for inspecting defects of a secondary battery having a pair of pressing jigs which press an outer surface of an electrode or a pouch accommodating the electrode assembly in directions corresponding to each other and on which a plurality of protrusions protrude from pressing surfaces and a measurement unit measuring one or more of current, a voltage, and resistance of the electrode assembly when the electrode assembly is pressed by the plurality of protrusions of the pair of pressing jigs is provided.
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