Invention Grant
- Patent Title: Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysis
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Application No.: US17438752Application Date: 2020-12-03
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Publication No.: US11797557B2Publication Date: 2023-10-24
- Inventor: Fei Yuan , Hong Wang , Jianmin Wu , Guoliang Shen , Tian Lan , Yue Tang , Haohan Wu , Yingli Zeng , Jianzhou Wang , Guanchun Bai
- Applicant: BOE Technology Group Co., Ltd.
- Applicant Address: CN Beijing
- Assignee: BOE Technology Group Co., Ltd.
- Current Assignee: BOE Technology Group Co., Ltd.
- Current Assignee Address: CN Beijing
- Agency: Intellectual Valley Law, P.C.
- International Application: PCT/CN2020/133681 2020.12.03
- International Announcement: WO2022/116107A 2022.06.09
- Date entered country: 2021-09-13
- Main IPC: G06F16/00
- IPC: G06F16/00 ; G06F16/25 ; G06F16/28 ; G06F16/215 ; G06F16/23 ; H04L67/63 ; G06F3/0482 ; G06F7/08 ; H04L67/1008 ; H04L67/1097

Abstract:
A data management platform for intelligently managing data is provided. The data management platform includes an ETL module configured to extract, cleanse, transform, or load data; a data lake configured to store a first group of data formed by extracting raw data from a plurality of data sources by the ETL module; a data warehouse configured to store a second group of data formed by cleansing and standardizing on the first group of data; a general data layer configured to store a third group of data formed by subjecting the second group of data to data fusion; and a data mart configured to store a fourth group of data formed by transforming the third group of data by the ETL module. The general data layer is a distributed data storage storing information available for querying. The data mart is a database of NoSQL type storing information available for computational processing.
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