Invention Grant
- Patent Title: Localization of potential issues to objects
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Application No.: US17466856Application Date: 2021-09-03
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Publication No.: US11803433B2Publication Date: 2023-10-31
- Inventor: David Nellinger Adamson , Aditya Samalla , Raymond Mark Cooke
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Spring
- Agency: Trop, Pruner & Hu, P.C.
- Main IPC: G06F11/07
- IPC: G06F11/07

Abstract:
In some examples, a system identifies a potential issue based on comparing measurement data acquired at different hierarchical levels of a computing environment. Within a hierarchical level of the different hierarchical levels, the system determines, based on measurement data acquired for objects in the hierarchical level, whether the potential issue is localized to a subset of the objects.
Public/Granted literature
- US20210397508A1 LOCALIZATION OF POTENTIAL ISSUES TO OBJECTS Public/Granted day:2021-12-23
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