Invention Grant
- Patent Title: Semiconductor devices and methods of manufacturing semiconductor devices
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Application No.: US17654486Application Date: 2022-03-11
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Publication No.: US11804438B2Publication Date: 2023-10-31
- Inventor: Yong Kong Siew , Wei Hsiung Tseng , Changhwa Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. CHAU & ASSOCIATES, LLC
- Priority: KR 20160128352 2016.10.05
- Main IPC: H01L29/41
- IPC: H01L29/41 ; H01L23/535 ; H01L23/485 ; H01L21/768 ; H01L29/06 ; H01L29/417 ; H01L29/66 ; H01L29/78 ; H01L29/165 ; H01L21/285

Abstract:
A semiconductor device includes a substrate having an active region, a gate structure disposed on the active region, a source/drain region disposed in the active region at a side of the gate structure, a first interlayer insulating layer and a second interlayer insulating layer sequentially disposed on the gate structure and the source/drain region, a first contact plug connected to the source/drain region through the first interlayer insulating layer, a second contact plug connected to the gate structure through the first interlayer insulating layer and the second interlayer insulating layer, a first metal line disposed on the second interlayer insulating layer, and having a metal via disposed in the second interlayer insulating layer and connected to the first contact plug, and a second metal line disposed on the second interlayer insulating layer, and directly connected to the second contact plug.
Public/Granted literature
- US20220199534A1 SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES Public/Granted day:2022-06-23
Information query
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