Invention Grant
- Patent Title: Measurement apparatus
-
Application No.: US17811983Application Date: 2022-07-12
-
Publication No.: US11804911B2Publication Date: 2023-10-31
- Inventor: Frank Op 't Eynde , Olivier Crand , Milad Piri
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP 305919 2020.08.10
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04B17/00

Abstract:
A measurement apparatus comprising a first terminal to receive an input signal of a circuit under test; a second terminal to receive an output signal of the circuit under test. A first and second phase splitter configured to generate a first and second phase signal, I1 and I2, and a first and second quadrature signal, Q1 and Q2. A first and second multiplexer, each coupled to the first terminal and the second terminal and configured to alternately pass the input and output signals of the circuit under test to the inputs of the first and second phase splitters. A double-quadrature mixer having four inputs configured to receive I1, Q1, I2, and Q2, and an output. A calculation unit to determine one or both of a phase shift of the circuit under test and/or a gain of the circuit under test based on the output of the double-quadrature mixer.
Public/Granted literature
- US20220360345A1 MEASUREMENT APPARATUS Public/Granted day:2022-11-10
Information query