Invention Grant
- Patent Title: Method and apparatus for measuring signal
-
Application No.: US16655817Application Date: 2019-10-17
-
Publication No.: US11806124B2Publication Date: 2023-11-07
- Inventor: JongPal Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR 20190053093 2019.05.07
- Main IPC: A61B5/053
- IPC: A61B5/053 ; H03F3/45 ; H03M1/12 ; A61B5/00

Abstract:
A signal measuring apparatus and method is provided. The signal measuring apparatus inputs a reduced voltage signal to an input end of an amplifier by resetting a voltage signal, which is acquired by applying a known current signal to a target object, using a common mode voltage at least once during one period of a current signal. The signal measuring apparatus acquires a digital signal corresponding to an object impedance change by converting an output of the amplifier.
Information query