Invention Grant
- Patent Title: Measurement method and apparatus
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Application No.: US17039351Application Date: 2020-09-30
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Publication No.: US11818601B2Publication Date: 2023-11-14
- Inventor: Bingzhao Li , Li Chai , Lei Chen
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Slater Matsil, LLP
- Priority: CN 1810300767.4 2018.04.04
- Main IPC: H04J11/00
- IPC: H04J11/00 ; H04W24/08 ; H04W24/10 ; H04W36/00 ; H04W56/00 ; H04W72/00 ; H04W76/11 ; H04W76/15 ; H04W84/02 ; H04W88/02 ; H04W88/08 ; H04W88/12 ; H04W92/02 ; H04W92/10 ; H04W92/12 ; H04W92/20 ; H04W72/27 ; H04W72/231

Abstract:
This application provides a measurement method and an apparatus. In the measurement method, a communications apparatus may receive configuration information, where the configuration information includes a cell list and indication information, and the indication information is used to indicate whether a measurement event is affected by the cell list; and the communications apparatus performs a measurement evaluation based on the cell list and the indication information. In this implementation, whether to perform a trigger evaluation for a measurement result of a cell in the cell list may be determined depending on whether the measurement event is affected by the cell list, to avoid an unnecessary trigger evaluation for a cell.
Public/Granted literature
- US20210014718A1 MEASUREMENT METHOD AND APPARATUS Public/Granted day:2021-01-14
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