Invention Grant
- Patent Title: Security scanning inspection system and method
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Application No.: US17255394Application Date: 2020-01-06
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Publication No.: US11822040B2Publication Date: 2023-11-21
- Inventor: Yanwei Xu , Weifeng Yu , Yu Hu , Chunguang Zong , Shangmin Sun
- Applicant: TSINGHUA UNIVERSITY , NUCTECH (BEIJING) COMPANY LIMITED , NUCTECH COMPANY LIMITED
- Applicant Address: CN Beijing
- Assignee: TSINGHUA UNIVERSITY,NUCTECH (BEIJING) COMPANY LIMITED,NUCTECH COMPANY LIMITED
- Current Assignee: TSINGHUA UNIVERSITY,NUCTECH (BEIJING) COMPANY LIMITED,NUCTECH COMPANY LIMITED
- Current Assignee Address: CN Beijing
- Agency: KILPATRICK TOWNSEND & STOCKTON, LLP
- Priority: CN 1910009034.X 2019.01.04
- International Application: PCT/CN2020/070470 2020.01.06
- International Announcement: WO2020/140997A 2020.07.09
- Date entered country: 2020-12-22
- Main IPC: G01S17/894
- IPC: G01S17/894 ; G01V5/00

Abstract:
The present disclosure relates to a security scanning inspection system and method. The security scanning inspection system comprises a detector, a scanning device and a controller, wherein the detector is configured to detect a protective attribute of an object to be inspected; the scanning device is movably arranged and the scanning device is configured to emit a scanning ray during movement to perform a security scanning inspection on the object to be inspected, the scanning device comprising at least two working modes, wherein a dose of a scanning ray in each working mode is different from a dose of a scanning ray in any other working modes; and the controller configured to select a working mode of the scanning device according to the protective attribute of the object to be inspected detected by the detector.
Public/Granted literature
- US20210270991A1 SECURITY SCANNING INSPECTION SYSTEM AND METHOD Public/Granted day:2021-09-02
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