- 专利标题: Tagged memory operated at lower vmin in error tolerant system
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申请号: US17742987申请日: 2022-05-12
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公开(公告)号: US11836346B2公开(公告)日: 2023-12-05
- 发明人: Nitin Chawla , Giuseppe Desoli , Anuj Grover , Thomas Boesch , Surinder Pal Singh , Manuj Ayodhyawasi
- 申请人: STMICROELECTRONICS S.r.l. , STMicroelectronics International N.V.
- 申请人地址: IT Agrate Brianza
- 专利权人: STMICROELECTRONICS S.r.l.,STMicroelectronics International N.V.
- 当前专利权人: STMICROELECTRONICS S.r.l.,STMicroelectronics International N.V.
- 当前专利权人地址: IT Agrate Brianza; CH Geneva
- 代理机构: SEED INTELLECTUAL PROPERTY LAW GROUP LLP
- 主分类号: G06F3/06
- IPC分类号: G06F3/06 ; G06N3/08
摘要:
A memory array arranged as a plurality of memory cells. The memory cells are configured to operate at a determined voltage. A memory management circuitry coupled to the plurality of memory cells tags a first set of the plurality of memory cells as low-voltage cells and tags a second set of the plurality of memory cells as high-voltage cells. A power source provides a low voltage to the first set of memory cells and provides a high voltage to the second set of memory cells based on the tags.
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