Invention Grant
- Patent Title: Method and device for determining at least one parameter of an object
-
Application No.: US16956840Application Date: 2018-12-20
-
Publication No.: US11841418B2Publication Date: 2023-12-12
- Inventor: Ralph Mende , Christoph Weihrauch
- Applicant: S.M.S. SMART MICROWAVE SENSORS GMBH
- Applicant Address: DE Braunschweig
- Assignee: S.M.S. SMART MICROWAVE SENSORS GMBH
- Current Assignee: S.M.S. SMART MICROWAVE SENSORS GMBH
- Current Assignee Address: DE Braunschweig
- Agency: WC&F IP
- Priority: DE 2017131114.9 2017.12.22
- International Application: PCT/EP2018/086198 2018.12.20
- International Announcement: WO2019/122130A 2019.06.27
- Date entered country: 2020-06-22
- Main IPC: G01S13/58
- IPC: G01S13/58 ; G01S13/38 ; G01S13/931 ; G01S13/53
Abstract:
The invention relates to a method for determining at least one parameter of an object, wherein the method comprises the following steps:
a. provision of a range-Doppler matrix,
b. transfer of at least one part of the range-Doppler matrix to a neural network and
c. identification of the at least one parameter by the neural network.
a. provision of a range-Doppler matrix,
b. transfer of at least one part of the range-Doppler matrix to a neural network and
c. identification of the at least one parameter by the neural network.
Public/Granted literature
- US20200333453A1 METHOD AND DEVICE FOR DETERMINING AT LEAST ONE PARAMETER OF AN OBJECT Public/Granted day:2020-10-22
Information query
