Invention Grant
- Patent Title: Inspection method and inspection system
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Application No.: US17638248Application Date: 2020-08-28
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Publication No.: US11846583B2Publication Date: 2023-12-19
- Inventor: Takanobu Ojima , Hideto Motomura , Rina Akaho , Yoshinori Matsui
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP 19178081 2019.09.27
- International Application: PCT/JP2020/032537 2020.08.28
- International Announcement: WO2021/059858A 2021.04.01
- Date entered country: 2022-02-25
- Main IPC: G01N21/27
- IPC: G01N21/27 ; G01N21/25

Abstract:
Provided are an inspection method, a program, and an inspection system capable of improving accuracy of inspecting a color of a surface of an object. The inspection method includes acquisition step and comparison step. Acquisition step is a step of acquiring a target image of a surface of an object obtained by an imaging system imaging the surface of the object illuminated by an illumination system. Comparison step is a step of comparing a color of an attention region on the target image with a color of a reference region. The reference region is a region of a reference image of a surface of a reference object as a reference of a color of the object, and a region corresponding to a combination of an incident angle of light from the illumination system and a reflection angle of light to the imaging system in the attention region.
Public/Granted literature
- US20220326145A1 INSPECTION METHOD, PROGRAM, AND INSPECTION SYSTEM Public/Granted day:2022-10-13
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