Invention Grant
- Patent Title: Device and method for measuring depth of object
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Application No.: US17602645Application Date: 2021-09-24
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Publication No.: US11852823B2Publication Date: 2023-12-26
- Inventor: Sangho Yoon , Jongchul Choi , Jaewoo Ko , Bonkon Koo
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR 20200130460 2020.10.08
- International Application: PCT/KR2021/013059 2021.09.24
- International Announcement: WO2022/075642A 2022.04.14
- Date entered country: 2021-10-08
- Main IPC: G02B27/00
- IPC: G02B27/00 ; G01S17/894 ; G01B11/25 ; G06T19/00 ; G02B27/01

Abstract:
A method, by an augmented reality device, of measuring a depth of an object includes determining, from a dot-pattern and a surface-pattern, a pattern of light to be emitted for measuring the depth of the object, identifying, from within an entire area of a pattern generator, a partial area of a light source unit corresponding to an area for the determined pattern, emitting light through the area for the determined pattern, by activating the identified partial area of the light source unit, receiving light reflected from the object; and measuring the depth of the object based on the emitted light and the received reflected light.
Public/Granted literature
- US20230122125A1 DEVICE AND METHOD FOR MEASURING DEPTH OF OBJECT Public/Granted day:2023-04-20
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