Invention Grant
- Patent Title: Method for inspecting display device and method for fabricating display device
-
Application No.: US17166445Application Date: 2021-02-03
-
Publication No.: US11854445B2Publication Date: 2023-12-26
- Inventor: Hyung Jin Lee , Sang Heon Ye , Se Yoon Oh
- Applicant: Samsung Display Co., LTD.
- Applicant Address: KR Yongin-si
- Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee: SAMSUNG DISPLAY CO., LTD.
- Current Assignee Address: KR Yongin-si
- Agency: KILE PARK REED & HOUTTEMAN PLLC
- Priority: KR 20200059651 2020.05.19
- Main IPC: G09G3/00
- IPC: G09G3/00 ; H01L51/56 ; G01N21/956 ; G01N21/88 ; H10K71/00

Abstract:
A method for inspecting a display device includes preparing a target substrate comprising sub-pixels in which light-emitting elements are disposed, dividing each of first regions of the sub-pixels into second regions, obtaining a gray value of each of the second regions, generating a random number using the gray value, calculating a representative value of each of the first regions by reflecting variables in the random number, and summing the representative values of the first regions to calculate a number of light-emitting elements of the sub-pixels.
Public/Granted literature
- US20210366329A1 METHOD FOR INSPECTING DISPLAY DEVICE AND METHOD FOR FABRICATING DISPLAY DEVICE Public/Granted day:2021-11-25
Information query