Invention Grant
- Patent Title: Magnetic slurry for highly efficiency CMP
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Application No.: US17364313Application Date: 2021-06-30
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Publication No.: US11854827B2Publication Date: 2023-12-26
- Inventor: Yen-Ting Chen , Chun-Hao Kung , Tung-Kai Chen , Hui-Chi Huang , Kei-Wei Chen
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- The original application number of the division: US16207802 2018.12.03
- Main IPC: H01L21/321
- IPC: H01L21/321 ; B24B57/02 ; B24B37/04 ; B01F13/08 ; C09K3/14 ; B01F33/452

Abstract:
A chemical-mechanical polishing (CMP) system includes a head, a polishing pad, and a magnetic system. The slurry used in the CMP process contains magnetizable abrasives. Application and control of a magnetic field, by the magnetic system, allows precise control over how the magnetizable abrasives in the slurry may be drawn toward the wafer or toward the polishing pad.
Public/Granted literature
- US20210327720A1 Magnetic Slurry for Highly Efficiency CMP Public/Granted day:2021-10-21
Information query
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