Invention Grant
- Patent Title: Semiconductor package including a chip pad having a connection portion and test portion in a first surface of the chip pad
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Application No.: US17196538Application Date: 2021-03-09
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Publication No.: US11854912B2Publication Date: 2023-12-26
- Inventor: Joonsung Kim , Yonghwan Kwon , Sanguk Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR 20200107423 2020.08.25
- Main IPC: H01L21/66
- IPC: H01L21/66 ; H01L23/00 ; H01L23/31

Abstract:
A semiconductor package is provided. The semiconductor package includes a chip pad of a semiconductor chip, the chip pad including a connection portion and a test portion in a first surface of the chip pad; a barrier layer covering the chip pad, the barrier layer defining a first opening and a second opening that is separate from the first opening, the first opening exposing the connection portion of the chip pad, and the second opening exposing the test portion of the chip pad; and a redistribution structure.
Public/Granted literature
- US20220068730A1 SEMICONDUCTOR PACKAGE Public/Granted day:2022-03-03
Information query
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